Yield Management Software
Genesis® software delivers parametric, defect and memory solutions in a cost-effective and extensible software platform, enabling data analysis, automated decision making through patented data mining, and custom methodology development through workflow and scripting. Specialized analysis algorithms identify and correct spatial anomalies, wafer processing sequence problems, commonality of effects, detection of outliers and trends, and yield modeling to assess the impact of the design on the "manufacturability" of the resulting chip. Versions are offered for enterprise and fabless customers.